2015-10

Investigation of the Structural, Optical and Electrical Properties of Copper Selenide Thin Films

AbstractCopper selenide (CuSe) thin films were prepared by chemical bath deposition (CBD) method. X-ray diffraction (XRD) analysis was used to study the structure and crystallite size of CuSe thin film. The grain size and the surface morphology were studied using Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM). The optical properties were studied using the UV-Visible transmission spectrum. The dielectric properties of the synthesized CuSe thin films were studied at different frequencies and different temperatures. Further, electronic properties, such as valence electron pl...

Texto completo