Tbulk-BICS : a Built-in current sensor robust to process and temperature variations for soft error detection

AUTOR(ES)

Henes Neto, Egas

DATA DE PUBLICAÇÃO

2011

RESUMO

This paper presents a parameterized current sensor able to detect transient ionization in the silicon substrate. Each sensor is controlled by a set of trimming bits that can be used to attune the sensitivity of the sensor compensating process and temperature variations. By choosing different configurations in the trimming bits, it is possible to adjust the performance of the sensor, which can increase the number of transistors monitored by a single sensor reducing the area overhead. Monte Carlo simulations are used to evaluate the sensor behavior. Results from a case-study circuit with embedded Tbulk-BICS confirm the efficiency of the technique.

ASSUNTO(S)

built-in current sensor microeletronica fault tolerance process variations soft errors

Documentos Relacionados

• Using bulk built-in current sensors to detect soft errors
• Antiviral response elicited by a completely synthetic antigen with built-in adjuvanticity.
• Translational induction of heat shock transcription factor σ32: evidence for a built-in RNA thermosensor
• A logic built-in self-test architecture that reuses manufacturing compressed scan test patterns
• SNAPc: a core promoter factor with a built-in DNA-binding damper that is deactivated by the Oct-1 POU domain