Non-resonant Permittivity Measurement Methods
AUTOR(ES)
Severo, Sergio L. S., Salles, Álvaro A. A. de, Nervis, Bruno, Zanini, Braian K.
FONTE
J. Microw. Optoelectron. Electromagn. Appl.
DATA DE PUBLICAÇÃO
2017-03
RESUMO
Abstract The measurement of the dielectric properties of materials has been applied in non-destructive tests, humidity measurement, soil analysis and even cancer detection. The methods have been developed for over 70 years based on the interaction of the electromagnetic waves with the material under test. This work presents a general model of scattering parameters for non-resonant methods of transmission/reflection and single-port reflection. Equations for determining permittivity are obtained. New equations for short-circuited load and coupled load in the double reflection method are presented.
